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SLDIAG对与随机地址内存测试所替换的DIMM不同的DIMM返回错误状态

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问题描述

*> sldiag device run -dev mem

  • 完成SLDIAG测试时、"随机地址内存测试"可能会显示为错误状态:

*> sldiag device status

To see details use: sldiag device status -long
Device     TestName      StartDate       EndDate        Status    LOOP
----------   ---------------- ------------------- ------------------- ---------- --------
mem      Memory Details   Mon Jan  2 11:42:03 Mon Jan  2 11:42:03 Completed  1/1
mem      Random Address Mem Test
                Mon Jan  2 11:42:03 Mon Jan  2 11:48:46 ERROR    1/1

mem      Random Data Mem Test
                Mon Jan  2 11:48:46 N/A          Running   0/1
There are still test(s) being processed.

  • 经过进一步调查、在与更换的DIMM不同的DIMM上发现可更正的错误(CECC):

*> sldiag device status -dev mem -long -state failed

TEST START ------------------------------------------
DEVTYPE: mem
NAME: Random Address Mem Test
START DATE: Mon Jan  2 11:42:03 GMT 2023

STATUS: Completed

Running Random Address Mem Test

MAX memory in D-blade = 8080000000

RANGE:0 in D-blade = 0x0 to 0x7e000

Initial CECC count: 0
Checking for diag owned mem

RANGE:1 in D-blade = 0x80000 to 0x87000

RANGE:2 in D-blade = 0x100000 to 0x6111e000

RANGE:3 in D-blade = 0x6915f000 to 0x6a782000

RANGE:4 in D-blade = 0x6b96e000 to 0x7519c000

RANGE:5 in D-blade = 0x751a2000 to 0x7999f000

RANGE:6 in D-blade = 0x7b7ff000 to 0x7b800000

RANGE:7 in D-blade = 0x100000000 to 0x8080000000
Testing diag owned range 0x1d1d6aa300 to 0x6971fca300

2 CECC Reported on DIMM :7

Memory errors:CECC count: 2
END DATE: Mon Jan  2 11:48:46 GMT 2023

LOOP: 1/1
TEST END --------------------------------------------

 

 

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