FAS9000 或 AFF A700 系统上出现错误的 "NVS PCIe Die Temp is Critical Low （ 0C ） " 错误信息
适用于
- AFF-A700
- FAS9000
问题
- EMS 日志报告以下事件、 PCIw_Die_Temp 传感器返回正确的读数、传感器事件在一分钟内取消声明。
示例：
00:09:59 [node1: env_mgr: monitor.chassisTemperature.cool:alert]: Chassis temperature is too cool: NVS PCIe Die Temp is critical low (0 C).
00:10:00 [node1: monitor: monitor.globalStatus.critical:EMERGENCY]: Chassis temperature is too low.
00:10:20 [node1: env_mgr: monitor.chassisTemperature.ok:notice]: Chassis temperature is ok.
- 服务处理器（ SP ）在系统事件日志（ SEL ）中报告以下断言错误，这些错误在一分钟内被取消断言。
示例：
23:00:26 [IPMI.notice]: 1800 | 02 | EVT: 01500005 | PCISW_Die_Temp | Assertion Event, "Lower Non-critical going low " | Reading: 0.000 | Threshold: 5.000
23:00:26 [IPMI.notice]: 1900 | 02 | EVT: 01520000 | PCISW_Die_Temp | Assertion Event, "Lower Critical going low " | Reading: 0.000 | Threshold: 0.000
23:00:26 [IPMI.notice]: 1a00 | 02 | EVT: 0301ffff | Attn_Sensor1 | Assertion Event, "State Asserted"
23:00:38 [IPMI.notice]: 1b00 | 02 | EVT: 6f02ffff | NVS_Status | Assertion Event, "Fault"
23:00:39 [IPMI.notice]: 1c00 | 02 | EVT: 81522700 | PCISW_Die_Temp | Deassertion Event, "Lower Critical going low " | Reading: 39.000 | Threshold: 0.000
23:00:39 [IPMI.notice]: 1d00 | 02 | EVT: 81502705 | PCISW_Die_Temp | Deassertion Event, "Lower Non-critical going low " | Reading: 39.000 | Threshold: 5.000
23:00:51 [IPMI.notice]: 1e00 | 02 | EVT: ef02ffff | NVS_Status | Deassertion Event, "Fault"
23:00:53 [IPMI.notice]: 1f00 | 02 | EVT: 0300ffff | Attn_Sensor1 | Assertion Event, "State Deasserted"